Transistor Characteristic Apparatus Experiment, Physics instrument, general laboratory equipment manufacturers.

DV/DT Limitation Of SCR

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DV/DT Limitation Of SCR

DV/DT Limitation Of SCR


  • Test dv/dt estimation of the SCR
  • Compare Dv/Dt capability by gate-cathode terminations
  • Compare Dv/Dt capability by gate-cathode biasing (voltage biasing)
  • Compare Dv/Dt capability by gate-cathode biasing (current biasing)
  • To improve Dv/Dt capability by transistor snubber circuit
  • Effect of R.C. snubber circuit on Dv/Dt capability
  • Study of different scheme of R.C. Snubber circuit on Dv/Dt capability

Built in parts:

  • 300 V D.C. at 250 mA, power supply internally connected
  • Thyristor switch for applying sudden voltage on the SCR under experiment
  • The SCR under experiment
  • Resistance for gate-cathode termination
  • Silicon diode
  • Transistorized snubber circuit
  • Two schemes for R-C snubber circuits
  • Visual indication to indicate SCR firing
  • Adequate no. of other electronic components
  • Mains ON/OFF switch, fuse and jewel light


  • The unit is operative on 230 V ±10% at 50 Hz A.C. mains
  • Adequate no. of patch cords stackable 4 mm spring loaded plug length ½ meter
  • Good quality, reliable terminal/sockets are provided at appropriate places on panel for connections/ observation of waveforms
  • Weight: 3 kg. (approx.)
  • Dimension: W 340 x H 110 x D 210


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